HP 4275A MANUAL PDF

HP 4275A MANUAL PDF

This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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External dc bias source should be stable with low noise. For Phenomenon -1 – 2: Indicates dangerous voltage terminals fed from the interior by voltage exceeding volts must be so marked.

Index of /~kurt/manuals/manuals/HP Agilent

The junction inter-terminal capacitance of diodes, col- lector output capacitance of transistors, etc. However, the instrument should be protected from temperature extremes which cause condensation within the instru- ment. J Measuring circuit has an open- circuit or a short-circuit in the test lead or test fixture being used. The overall characteristics of sample can be clarified from these kinds of measurements.

The multi- spot test frequency and test level control functions featured in the A permits meas- uring the device to be tested under the prac- tical test conditions at which it actually operates. Accessories Available The prefix is the same for all identical instruments; it changes only when a change is made to the instrument.

An initial function test is automatically performed before measurement begins. Since the effect of test cables on measurements and the resultant measurement error increase in proportion to test frequency, cable length must be taken into consideration in high frequency measure- ments. The meanings of the option annunciations are outlined in paragraph The Self Test is a panel pushbutton function for elementary operator checks. To apply this manual to these instruments, make the following changes: When this function is set to AUTO, the Instru- ment automatically selects appro- priate parallel or series equivalent circuit.

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External DC Bias T Protective hinged cover of B Test Fixture was opened while a measurement was being taken. The following gener- al instructions should be used for re-packing with commercially available materials: Measurement capabilities are also enhanced by the microprocessor permitting sophisticated control and powerful calculation capabilities.

Thus, measurement resolution becomes higher for lower sample values at the selected range and, accordingly, the numbers of digits displayed is changed to afford the best of the measurement capabilities. The section also includes information on in- itial inspection and damage claims, prepa- ration for using the A, packaging, storage, and shipment. Disconnect external DC bias from A. The A Multi -frequency LCR Meter is the instrument which embodies these ideas and which provides these measurement advan- tages.

Turns instrument on and readies instrument for meas- urement.

Instruments Covered by Manual manuall Test Fixture, tweezer type, 3 terminal. Most significant- ly, the A can be of particular help in the experimental assessment of devices in the semiconductor testing field. Note If one terminal is grounded, a signal current of equal magnitude an operating condition of the four terminal measurement configu- ration will not flow in the in- ner and outer conductors of the measurement cable.

The purpose of the current terminals is to cause a measurement signal current to flow through the sample. Alternating or direct current power line. Memorizes the following data and control settings: When you push the button, the pushbutton manuual lights and the diagnostic test is initiated. To break the data into two groups limits line length for outputting to certain pe- ripherals such as to an HP Model A Ther- mal Printer, the delimiter form bit on Manula board is set to 1 see paragraph Ranging operation has actuated a range on which the measurement can net be taken at the selected test frequency.

A LCR METER [Obsolete] | Keysight (formerly Agilent’s Electronic Measurement)

Reference numbers in the photos are keyed to the associated descriptions. For connecting the sample to be tested, the A employs measurement termi- mxnual in a four terminal pair configuration which has a significant measuring advantage for component parameter measurements requir- ing high accuracy in the high frequency region. The HP Model A Multi-frequency LCR Meter is a high performance, fully automatic test instrument designed to measure the vari- ous component measurement 42775a values of an impedance element in the relatively high frequency region.

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Measurement Accuracies sheet 4 of 9. Provides continuous memo- rization of control settings powered by stand-by battery. Free copies are available from all HP offices. The Model A is equipped with a three-conductor power cable which, when jp into an ap- propriate receptacle, grounds the instrument.

This occurs because the Lcur terminal is tied to circuit common through the range resistors. All segments of the numeric and character displays are also lit.

For example, the wavelength of a lOMHz test signal is 30 meters which is 30 times as long as the Im standard test cables.

Either dissipation factor, quality factor, equivalent series resistance, con- ductance, reactance, susceptance or phase angle can be selected in addition to the choice for L, C, R or 2 1 measurement.

This section covers specifications, instru- ment identification, description, options, accessories, and other basic information. Manial the resonant frequency fo, this component is purely resistive. Test Leads with miniature rf connectors for system appli- cations, 4-terminal pair, ‘ Im long.

Return the in- strument to a Hewlett-Packard Sales and Service Office for service and repair to mnual that safety features are maintained.

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Semiconductor Device Measurement The effective resist- ance increases at resonance even if the in- ductor has ideally no resistance at dc. Residual — Offsets high inductance capacitance measurements. The A Option adds an internal remotely controllable dc bias ho variable from.

Note that the dissipation factor is the same in both equivalent cir- cuit representations. Storage and Shipment This pushbutton en- hances measurement resolution by av- eraging measured values over every ten measurements.